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首页> 外文会议>Conference on Ultraviolet Ground- and Space-based Measurements, Models, and Effects, Jul 30-Aug 1, 2001, San Diego, USA >Comparison of different methods for the determination of the average UV albedo in a mountainous terrain
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Comparison of different methods for the determination of the average UV albedo in a mountainous terrain

机译：确定山区平均紫外线反照率的不同方法的比较

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摘要

One aim of the project CUVRA was to improve the modeling of effects of inhomogeneous albedo fields on ground UV irradiance. For the determination of the effect of heterogeneous illumination (shading effects, inclination and orientation of the facet) on the reflectivity of a facet in a mountainous region more complex approaches (than for the calculation of the reflectivity of flat surfaces) have to be chosen. We determined the 'effective' albedo for the surroundings of the Observatory Sonnblick (3106 m) by using three different methods. The first method consisted of a combination of a 3-D albedo model calculation and 1-D radiative transfer calculation. By using this method and a digital elevation map the reflectivity of the region surrounding Sonnblick Observatory was calculated. The second method was an inversion method using a 1-D radiative transfer model. The routine spectral UV measurements performed at Sonnblick were used to calculate the average effective albedo. The third method was entirely experimental. An albedo measuring system was used to perform reflectivity measurements of the surrounding of Sonnblick. Overall, the results showed that the average albedo of a topographically structured surface is lower than the average albedo of a corresponding (surface with same ground characteristics) flat surface.
机译：CUVRA项目的目标之一是改善非均匀反照率场对地面UV辐射的影响的建模。为了确定异构照明对山区反射的反射率的影响（阴影​​效果，倾斜度和方向），必须选择更复杂的方法（而不是计算平坦表面的反射率）。我们通过三种不同方法确定了Sonnblick天文台（3106 m）周围环境的“有效”反照率。第一种方法由3-D反照率模型计算和一维辐射传递计算组成。通过使用此方法和数字高程图，计算了Sonnblick天文台周围区域的反射率。第二种方法是使用一维辐射传递模型的反演方法。 Sonnblick执行的常规光谱UV测量用于计算平均有效反照率。第三种方法完全是实验性的。使用反照率测量系统对Sonnblick周围环境进行反射率测量。总体而言，结果表明，地形结构化表面的平均反照率低于相应（具有相同地面特征的表面）平坦表面的平均反照率。

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