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Simulation of microwave power characteristics of AlGaN/AlN/GaN HEMT

机译:AlGaN / AlN / GaN HEMT的微波功率特性仿真

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摘要

A systematic AlGaN/AlN/GaN HEMT physical based numerical model is established in this paper. This model includes field-dependent mobility, polarization effect, interface state, surface state, and traps. The model has been implemented into TCAD Silvaco. And the simulated DC and RF characterization fit the measured results well. The effects of source field plate on AlGaN/AlN/GaN HEMT breakdown voltage and DC drain current is also studied based on the established model. The off-state breakdown voltage was significantly improved by employing a source field plate. This is because the source field plate redistributes the electric fields in the gate-to-drain region.
机译:建立了系统的基于AlGaN / AlN / GaN HEMT的物理数值模型。该模型包括与场有关的迁移率,极化效应,界面态,表面态和陷阱。该模型已在TCAD Silvaco中实现。模拟的直流和射频特性很好地拟合了测量结果。在建立模型的基础上,研究了源极场板对AlGaN / AlN / GaN HEMT击穿电压和直流漏极电流的影响。通过使用源极场板,可以大大提高截止状态的击穿电压。这是因为源极场板会在栅极到漏极区域重新分布电场。

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