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High energy near- and far-field ptychographic tomography at the ESRF

机译：ESRF上的高能近场和远场断层扫描

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摘要

In high-resolution tomography, one needs high-resolved projections in order to reconstruct a high-quality 3D map of a sample. X-ray ptychography is a robust technique which can provide such high-resolution 2D projections taking advantage of coherent X-rays. This technique was used in the far-field regime for a fair amount of time, but it can now also be implemented in the near-field regime. In both regimes, the technique enables not only high-resolution imaging, but also high sensitivity to the electron density of the sample. The combination with tomography makes 3D imaging possible via ptychographic X-ray computed tomography (PXCT), which can provide a 3D map of the complex-valued refractive index of the sample. The extension of PXCT to X-ray energies above 15 keV is challenging, but it can allow the imaging of object opaque to lower energy. We present here the implementation and developments of high-energy near- and far-field PXCT at the ESRF.
机译：在高分辨率层析成像中，为了重建样本的高质量3D地图，需要高分辨率的投影。 X射线刻印术是一种强大的技术，可以利用相干X射线提供此类高分辨率2D投影。该技术在远场环境中使用了相当长的时间，但现在也可以在近场环境中实施。在这两种情况下，该技术不仅可以实现高分辨率成像，而且还可以对样品的电子密度具有很高的灵敏度。与断层摄影术的结合使通过Ptychographic X射线计算机断层摄影术（PXCT）进行3D成像成为可能，这可以提供样品的复数值折射率的3D图。将PXCT扩展到15 keV以上的X射线能量具有挑战性，但是它可以使不透明的对象成像以降低能量。我们在这里介绍ESRF高能近场和远场PXCT的实施和发展。

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