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Establishment of metrological traceability in porosity measurements by X-ray computed tomography

机译：通过X射线计算机断层扫描建立孔隙度测量计量学可追溯性

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Internal porosity is an inherent phenomenon to many manufacturing processes, such as casting, additive manufacturing, and others. Since these defects cannot be completely avoided by improving production processes, it is important to have a reliable method to detect and evaluate them accurately. The accurate evaluation becomes even more important concerning current industrial trends to minimize size and weight of products on one side, and enhance their complexity and performance on the other. X-ray computed tomography (CT) has emerged as a promising instrument for holistic porosity measurements offering several advantages over equivalent methods already established in the detection of internal defects. The main shortcomings of the conventional techniques pertain to too general information about total porosity content (e.g. Archimedes method) or the destructive way of testing (e.g. microscopy of cross-sections). On the contrary, CT is a nondestructive technique providing complete information about size, shape and distribution of internal porosity. However, due to the lack of international standards and the fact that it is relatively a new measurement technique, CT as a measurement technology has not yet reached maturity. This study proposes a procedure for the establishment of measurement traceability in porosity measurements by CT including the necessary evaluation of measurement uncertainty. The traceability transfer is carried out through a novel reference standard calibrated by optical and tactile coordinate measuring systems. The measurement uncertainty is calculated following international standards and guidelines. In addition, the accuracy of porosity measurements by CT with the associated measurement uncertainty is evaluated using the reference standard.
机译：内部孔隙率是许多制造过程的固有现象，例如铸造，增材制造等。由于无法通过改进生产流程来完全避免这些缺陷，因此，有一种可靠的方法来准确地检测和评估它们很重要。对于当前的工业趋势而言，准确评估变得尤为重要，一方面要减小产品的尺寸和重量，另一方面要提高其复杂性和性能。 X射线计算机断层扫描（CT）已经成为一种用于整体孔隙率测量的有前途的仪器，与内部缺陷检测中已经建立的等效方法相比，它具有许多优点。常规技术的主要缺点在于关于总孔隙率含量太一般的信息（例如阿基米德法）或破坏性的测试方法（例如横截面的显微镜检查）。相反，CT是一种无损技术，可提供有关内部孔隙大小，形状和分布的完整信息。但是，由于缺乏国际标准以及它是相对较新的测量技术，因此CT作为一种测量技术尚未成熟。这项研究提出了一种在CT孔隙度测量中建立测量可追溯性的程序，包括对测量不确定度的必要评估。可追溯性转移是通过一种新颖的参考标准进行的，该参考标准由光学和触觉坐标测量系统校准。测量不确定度是根据国际标准和准则计算的。此外，使用参考标准评估通过CT进行的孔隙度测量的准确性以及相关的测量不确定度。

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