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首页> 外文会议>Digital fabrication 2010 : Technical programs and proceedings >Measurement of Diode to Diode Spacing
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Measurement of Diode to Diode Spacing

机译：二极管到二极管间距的测量

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Laser printers with multiple laser diodes in a single diode package may have diode to diode spacing requirements critical to print quality. Standard off-the-shelf equipment is seldom designed to measure to the nanometer resolutions and linearity desired, especially if the measurements are time constrained. Therefore characterizing the linearity of the measurement system is important to the understanding of the measurement system limitations.rnDiode to diode spacing is a comparison of the centroids of multiple adjacent laser spots in one or more axes. It is physically possible to measure the centroid location of the spots using various methods including scanning aperture, CCD/CMOS cameras or position sensing devices. The accuracies and precisions desired for good measurements as well as for good manufacturing process capabilities are often smaller than what are easily available with these products, often by an order of magnitude.rnA procedure has been developed to estimate the measurement system error over a wide range of scales. It can be applied to several of the common laser spot centroid measurement devices enabling estimation of measurement resolution of the relative centroid. This method is based on an innovative technique involving controllable movement on a much larger scale.
机译：在单个二极管封装中具有多个激光二极管的激光打印机可能对打印质量具有至关重要的二极管间距要求。很少设计标准的现成设备来测量所需的纳米分辨率和线性度，尤其是在测量受到时间限制的情况下。因此，表征测量系统的线性度对于理解测量系统的局限性很重要。二极管到二极管的间距是一个或多个轴上多个相邻激光点质心的比较。使用各种方法（包括扫描孔径，CCD / CMOS相机或位置感应设备）在物理上可以测量光斑的质心位置。良好的测量以及良好的制造过程能力所需的精度和精度通常比这些产品容易获得的精度和精度小一个数量级。秤。它可以应用于几种常见的激光点质心测量设备，从而可以估算相对质心的测量分辨率。该方法基于一项创新技术，该技术涉及可控制的大规模运动。

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