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Detection Thresholds of Structured Noise in the Presence of Shot Noise

机译:散粒噪声存在下结构噪声的检测阈值

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An observer study was run to determine the detection thresholds of several representative examples of column fixed pattern noise, in the presence of varying levels of shot noise, which is known to mask structured noise. The data obtained were fit well at relevant shot noise levels by a simple model based on signal detection theory. Individual metrics of fixed pattern noise and shot noise, used in the masking equation, were computed from one dimensional integrations involving the capture noise power spectra (mapped to CIELAB space); the modulation transfer function of the display; the display pixel pitch; the viewing distance; and the S-CIELAB luminance contrast sensitivity function. The results of this work can be used to predict detection thresholds that can be added to photon transfer curves for the purpose of determining whether fixed pattern noise will be visible.
机译:进行了一项观察者研究,确定了在存在变化水平的散粒噪声(已知掩盖结构噪声)的情况下,列固定模式噪声的几个代表性示例的检测阈值。通过基于信号检测理论的简单模型,获得的数据在相关的散粒噪声水平下非常合适。根据涉及捕获噪声功率谱(映射到CIELAB空间)的一维积分,计算出掩蔽方程中使用的固定模式噪声和散粒噪声的各个指标;显示器的调制传递函数;显示像素间距;观看距离;和S-CIELAB亮度对比灵敏度功能。这项工作的结果可用于预测检测阈值,可以将这些阈值添加到光子传输曲线中,以确定确定的图案噪声是否可见。

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