首页> 外文会议>European Photovoltaic Solar Energy Conference; 20060904-08; Dresden(DE) >ATMOSPHERIC PRESSURE PECVD AND ATMOSPHERIC PLASMA CHEMICAL ETCHING FOR CONTINUOUS PROCESSING OF CRYSTALLINE SILICON SOLAR WAFERS
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ATMOSPHERIC PRESSURE PECVD AND ATMOSPHERIC PLASMA CHEMICAL ETCHING FOR CONTINUOUS PROCESSING OF CRYSTALLINE SILICON SOLAR WAFERS

机译:结晶硅太阳能晶片连续加工的常压PECVD和常压等离子体化学蚀刻

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Atmospheric pressure gas phase technologies will become essential for future concepts of in-line manufacturing of crystalline solar cells because of cost considerations. Important process steps to be transferred to atmospheric preassure plasma are the etching steps including saw damage etching, surface texturizing, phosphorus silicate glass etching, and edge isolation as well as the deposition of silicon nitride as anti-reflective and passivation layer. The application of two innovative atmospheric pressure plasma sources for solar cell processing has been evaluated: a linearly extended DC arc discharge and a microwave plasma source. Both show high rates for silicon etching of up to 11 μm/min by use of NF_3 and 7 μm/min for a mixture of SF_6 and oxygen. The surface structure can be controlled by adjusting the etch chemistry and the etch rate. PSG etching with rates of about 60 nm/min by use of several carbon fluoride containing etch gases is demonstrated. Silicon nitride films with refractive index of 2.1 and hydrogen content of 10 to 20 % are deposited with rates of up to 300 nm/min.
机译:由于成本方面的考虑,大气压气相技术对于晶体太阳能电池在线制造的未来概念将变得至关重要。转移到大气压力等离子体的重要工艺步骤是蚀刻步骤,包括锯损伤蚀刻,表面纹理化,磷硅酸盐玻璃蚀刻,边缘隔离以及氮化硅的沉积,以作为抗反射和钝化层。已经评估了两种创新的常压等离子体源在太阳能电池处理中的应用:线性扩展的直流电弧放电和微波等离子体源。两者均显示出通过使用NF_3进行的硅刻蚀速率高达11μm/ min,对于SF_6和氧气的混合物则为7μm/ min。可以通过调节蚀刻化学和蚀刻速率来控制表面结构。已证明通过使用几种含氟化碳的蚀刻气体以约60 nm / min的速度进行PSG蚀刻。以高达300 nm / min的速率沉积折射率为2.1,氢含量为10%至20%的氮化硅膜。

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