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Full-aperture x-ray tests of Kirkpatrick-Baez modules: preliminary results Full-aperture x-ray tests of Kirkpatrick-Baez modules: preliminary results

机译:Kirkpatrick-Baez模块的全口径X射线测试:初步结果 r n t r n r nKirkpatrick-Baez模块的全口径X射线测试:初步结果

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We report on preliminary results of full aperture X-ray optical tests at the X-ray test facility at the University of Colorado (USA) of four test modules of Kirkpatrick-Baez (KB) X-ray optical systems performed in August 2010. Direct experimental comparisons were made between gold-coated optics of two novel substrates: glass foils and silicon wafers. The preliminary results are promising, with full-width half-maxima of full stacks being of order of 30 arcsec in 2D full arrangement. These results justify further efforts to improve KB optics for use in low-cost, high-performance space-borne astronomical imaging instruments for X-ray wavelengths.
机译:我们报告了在2010年8月在美国科罗拉多大学的X射线测试设备上对Kirkpatrick-Baez(KB)X射线光学系统的四个测试模块进行的全孔径X射线光学测试的初步结果。Direct在两种新型基板的镀金光学元件之间进行了实验比较:玻璃箔和硅片。初步结果令人鼓舞,在2D完整排列中,整个堆栈的全宽半最大值约为30 arcsec。这些结果证明了进一步努力来改善用于X射线波长的低成本,高性能星载天文成像仪器中的KB光学器件的必要性。

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