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Novel intermediate reflector layer for optical and morphological tuning in the Micromorph thin film tandem cell

机译:新型中间反射层,用于微晶薄膜串联电池中的光学和形态调节

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摘要

PECVD growth of the microcrystalline silicon junction on a highly textured amorphous top cell often leads to defective absorber layers and finally to low quality bottom cell. This paper reports on the current status of using an innovative smoothening/reflective layer (SRL) as alternative intermediate reflector between top and bottom cell of a Micromorph tandem device deposited on as-grown highly textured LPCVD ZnO layer. Manufacturing of the SRL layer is realized by "liquid phase" deposition technologies. Optical and electrical properties, smoothening effect and photoelectrical results of Micromorph tandem devices are discussed. The implementation of our novel SRL results in the growth of a crack-free bottom cell and to an efficient current transfer from the bottom to the top cell.
机译:在高度纹理化的非晶顶部电池上的微晶硅结的PECVD生长通常会导致缺陷的吸收层,并最终导致低质量的底部电池。本文报道了使用创新的平滑/反射层(SRL)作为沉积在生长的高度织构的LPCVD ZnO层上的Micromorph串联器件的顶部和底部电池之间的中间反射器的当前状态。 SRL层的制造是通过“液相”沉积技术实现的。讨论了Micromorph串联器件的光电性能,平滑效果和光电结果。我们新颖的SRL的实施导致无裂纹底部电池的生长以及从底部电池到顶部电池的有效电流传输。

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  • 会议地点 San Francisco CA(US)
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    TEL Solar-Lab S.A., rue du Puits-Godet, 12a, 2000 Neuchatel, Switzerland;

    TEL Solar-Lab S.A., rue du Puits-Godet, 12a, 2000 Neuchatel, Switzerland;

    TEL Solar-Lab S.A., rue du Puits-Godet, 12a, 2000 Neuchatel, Switzerland;

    TEL Solar-Lab S.A., rue du Puits-Godet, 12a, 2000 Neuchatel, Switzerland;

    TEL Solar-Lab S.A., rue du Puits-Godet, 12a, 2000 Neuchatel, Switzerland;

    Haute Ecole Arc Ingenierie, Eplatures-Grise 17, 2300 La Chaux-de-Fonds, Switzerland;

    Haute Ecole Arc Ingenierie, Eplatures-Grise 17, 2300 La Chaux-de-Fonds, Switzerland;

    Haute Ecole Arc Ingenierie, Eplatures-Grise 17, 2300 La Chaux-de-Fonds, Switzerland;

    Haute Ecole Arc Ingenierie, Eplatures-Grise 17, 2300 La Chaux-de-Fonds, Switzerland;

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