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A Novel Process For Etching Modulated Profiles

机译：蚀刻调制轮廓的新方法

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摘要

A novel process for spot repair of damaged anodized aluminum panels is described. The process is based on etching the aluminum oxide layer using special fixtures that provide controlled, gradual transitions of the etched profile, enabling the fabrication of "borderline"-free repaired regions. The process does not require the application of etching masks. The profile of the etched region is solely controlled by the geometry of the specially developed etching fixture. Excellent agreement has been noted between experimental results and transport controlled models that predict the etching profile.
机译：描述了一种新的修复受损阳极氧化铝板的方法。该工艺基于使用特殊固定装置蚀刻氧化铝层的方法，该固定装置可提供蚀刻轮廓的受控，渐变过渡，从而能够制造“无边界线”的修复区域。该工艺不需要蚀刻掩模的应用。蚀刻区域的轮廓仅由专门开发的蚀刻夹具的几何形状控制。实验结果与预测蚀刻轮廓的传输控制模型之间已达成了极好的协议。

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  • 来源
    《Green electrodeposition 2》|2008年|13-30|共18页
  • 会议地点 Honolulu HI(US);Honolulu HI(US)
  • 作者

    R. W. Sporer; U. Landau; Hong-Hsiang (Harry) Kuo; Yar-Ming Wang;

  • 作者单位

    Department of Chemical Engineering, Case Western Reserve University, Cleveland, Ohio 44106, USA;

    Department of Chemical Engineering, Case Western Reserve University, Cleveland, Ohio 44106, USA;

    GM Research and Development Center, Warren, Michgan, 48090, USA;

    GM Research and Development Center, Warren, Michgan, 48090, USA;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 独立电源技术（直接发电）;
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