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Distribution of tellurium in melt-grown ZnSe(Te) crystals

机译:碲在熔融生长的ZnSe(Te)晶体中的分布

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The properties of semiconductor scintillation crystals are largely determined by the presence and distribution of the activator dopant. Influence of growth technological parameters (overheating #DELTA#T, inert gas pressure P, crystallization rate V_k) upon distribution of tellurium dopant was studied for ZnSe(Te) crystals grown by Bridgman technique in compression furnaces. Values of the "apparent" distribution coefficient of tellurium (k_Te) over crystal length were shown to be dependent on #DELTA#T and the related value of charge carry-over (#DELTA#m/m_0). It was established that at #DELTA#m/m_0=12
机译:半导体闪烁晶体的特性在很大程度上取决于活化剂掺杂剂的存在和分布。研究了布里奇曼技术在压缩炉中生长的ZnSe(Te)晶体的生长工艺参数(过热#DELTA#T,惰性气体压力P,结晶速率V_k)对碲掺杂剂分布的影响。碲(k_Te)在晶体长度上的“表观”分布系数的值显示为取决于#DELTA#T和电荷携带的相关值(#DELTA#m / m_0)。确定在#DELTA#m / m_0 = 12

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