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首页> 外文会议>High energy, optical, and infrared detectors for astronomy III >Count rate dependent non-linearity and pixel size variations in 1.7 micron cut-off detectors
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Count rate dependent non-linearity and pixel size variations in 1.7 micron cut-off detectors

机译：1.7微米截止检测器中计数速率相关的非线性和像素大小变化

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Over the past decade scientists have collected convincing evidence that the content of our universe is dominated by a mysterious dark energy. Understanding the nature of dark energy is a very difficult task, and requires a variety of independent experimental approaches. Most of these approaches rely on photometric calibrations over a wide range of intensities using standardized stars and internal reference sources, and hence on a complete understanding of the linearity of the detectors. The SNAP near infrared (NIR) instrument team has performed a comprehensive study of precision photometry on 1.7 micron cut-off HgCdTe detectors. Among those studies are the count rate dependent detector non-linearity that was recently discovered with the NICMOS array on the Hubble Space Telescope, and possible pixel size variations seen in quantum efficiency (QE) data. The non-linearity on NICMOS exhibits an unexpected behavior, where pixels with high (low) count rates detect slightly more (less) flux than expected for a linear system. To test this count rate dependent non-linearity a dedicated setup was built that produces a known amount of light on a detector, and measures its response as a function of light intensity and wavelength. If the pixel response variations seen in QE data are due to pixel area variations, standard flat-fielding will degrade photometry precision for point sources in an undersampled telescope. Studies have been performed to estimate the magnitude of pixel area variations.
机译：在过去的十年中，科学家收集了令人信服的证据，证明我们宇宙的内容被神秘的暗能量所支配。了解暗能量的性质是一项非常艰巨的任务，需要多种独立的实验方法。这些方法大多数都依赖于使用标准化恒星和内部参考源在很宽的强度范围内进行光度校准，因此完全依赖于探测器的线性度。 SNAP近红外（NIR）仪器团队对1.7微米截止HgCdTe检测器进行了精密光度法的全面研究。这些研究包括最近在哈勃太空望远镜上使用NICMOS阵列发现的与计数率相关的探测器非线性，以及量子效率（QE）数据中可能出现的像素尺寸变化。 NICMOS上的非线性表现出意想不到的行为，其中高（低）计数率的像素检测到的通量比线性系统预期的略多（较少）。为了测试与计数率有关的非线性，建立了一个专用的装置，该装置在检测器上产生已知量的光，并根据光强度和波长来测量其响应。如果在QE数据中看到的像素响应变化是由于像素面积变化引起的，则标准的平场会降低欠采样望远镜中点源的测光精度。已经进行了研究以估计像素面积变化的幅度。

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