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Ion emission from fused silica under 157-nm excimer laser irradiation at fluences below plasma formation threshold: the role of surface defects

机译:在低于等离子体形成阈值的注量下,在157 nm受激准分子激光辐照下,熔融石英中的离子发射:表面缺陷的作用

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At fluences well below the threshold for plasma formation, we have characterized the direct desorption of atomic ions from fused silica surfaces during 157-nm irradiation by time-resolved mass spectroscopy. The principal ions are Si~+ and O~+. The emission intensities are dramatically increased by treatments that increase the density of surface defects. Molecular dynamics simulations of the silica surface suggest that silicon ions bound at surface oxygen vacancies (analogous to E' centers) provide suitable configurations for the emission of Si~+. We propose that emission is best understood in terms of a hybrid mechanism involving both antibonding chemical forces (Menzel-Gomer-Redhead model) and repulsive electrostatic forces on the adsorbed ion after laser excitation of the underlying defect.
机译:在远低于等离子体形成阈值的注量下,我们已经表征了通过时间分辨质谱法在157 nm辐照过程中从熔融石英表面直接解吸原子离子。主离子为Si〜+和O〜+。通过增加表面缺陷密度的处理,发射强度大大提高。二氧化硅表面的分子动力学模拟表明,结合在表面氧空位(类似于E'中心)的硅离子为Si〜+的发射提供了合适的构型。我们提出,最好根据混合机理来理解发射,该混合机理涉及反键化学力(Menzel-Gomer-Redhead模型)和激光激发潜在缺陷后对吸附离子的排斥静电力。

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