首页> 外文会议>IMAPS 40th international symposium on microelectronics >Development of an M3-Approach for Optimal Electromagnetic Reliability in System Packages
【24h】

Development of an M3-Approach for Optimal Electromagnetic Reliability in System Packages

机译:开发M3方法以优化系统封装中的电磁可靠性

获取原文
获取原文并翻译 | 示例

摘要

This contribution presents a novel and comprehensive design approach – the M3-approach (methodologies->models->measures) for reliable, cost-effective and optimal design of system packages such as System-in-Package (SiP) or System-on-Package (SoP). This design approach entails developing or applying a methodology for efficient and accurate electrical modeling of the package and its immediate surroundings. The extracted models are experimentally validated and used to study the impact of different packaging technologies and integration options, component placement and routing possibilities, immediate surroundings as well as process tolerances on system performance. Based on the results of these studies, design measures are extracted. Applying these measures at the pre-layout stage leads to the elimination of re-design efforts and place/route iterations. Consequently time-to-market as well as cost is considerably reduced, while performance is optimized.
机译:这一贡献提出了一种新颖而全面的设计方法– M3方法(方法->模型->度量​​),用于可靠,经济高效地优化系统封装(例如,系统级封装(SiP)或系统级封装)封装(SoP)。这种设计方法需要开发或应用一种方法来对包装及其周围环境进行有效而准确的电气建模。提取的模型经过实验验证,用于研究不同封装技术和集成选项,组件放置和布线的可能性,周围环境以及工艺公差对系统性能的影响。根据这些研究的结果,提取设计措施。在预布局阶段应用这些措施可以消除重新设计工作和布局/布线迭代。因此,在优化性能的同时,大大缩短了产品上市时间和成本。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号