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Electric and Magnetic Scans of the Near Field of a PC Platform System Clock

机译:PC平台系统时钟近场的电磁扫描

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This paper describes a set of near field scans performed over the surface of a Pentium 4 class system clock. The scans were performed with electric and magnetic probes at a distance of 500 microns from the surface of the package and the silicon. The paper is divided into three sections. The first section describes results when the entire package is considered,the second part describes fine scale measurements,with a spatial resolution of 50 microns,performed over the silicon alone and the application of analytical surface operators,the last section describes how designers may use this approach to reduce silicon emissions in radio bands.
机译:本文介绍了在Pentium 4类系统时钟的表面上执行的一组近场扫描。扫描是用电和磁探针在距封装表面和硅500微米的距离处进行的。本文分为三个部分。第一部分描述了考虑整个封装时的结果,第二部分描述了仅在硅片上进行的精细分辨率测量(具有50微米的空间分辨率)以及分析表面操作员的应用,最后一部分描述了设计人员如何使用此方法减少无线电频带中硅辐射的方法。

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