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首页> 外文会议>Infrared Technology and Applications XXXIII pt.2; Proceedings of SPIE-The International Society for Optical Engineering; vol.6542 pt.2 >Resistance Non-Uniformity Correction Method using Bias Heating for Resistive Type Uncooled Microbolometer FPAs
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Resistance Non-Uniformity Correction Method using Bias Heating for Resistive Type Uncooled Microbolometer FPAs

机译：电阻式非冷却微测辐射热计FPA的偏压加热电阻非均匀校正方法

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摘要

This paper proposes a new resistance non-uniformity correction method for microbolometer-type uncooled thermal detector focal plane arrays (FPAs) that suffer from pixel-to-pixel resistance variation, which is conventionally corrected by applying a specific bias voltage to each detector by the use on-chip DACs. The proposed method uses the heating of the detector with electrical bias, where the detector is heated-up for a pre-determined period of time before the read-out phase. The proposed method uses only a heat-up signal source and simple digital blocks for each column, eliminating the need for DACs that occupy large area, contribute to the noise floor of the system, and dissipate extra power. The proposed method provides a detector current resolution of 14.5 nA with 9-bit digital data, which corresponds to the resolution of 12-bit DAC used in conventional methods.
机译：本文针对存在像素间电阻变化的微辐射热计型非冷却热探测器焦平面阵列（FPA）提出了一种新的电阻不均匀校正方法，该方法通常是通过向每个探测器施加特定的偏置电压来校正的。使用片上DAC。所提出的方法使用具有电偏压的检测器的加热，其中在读出阶段之前将检测器加热预定的时间段。所提出的方法仅对每一列使用加热信号源和简单的数字模块，从而无需占用大面积的DAC，有助于降低系统的本底噪声并消耗额外的功率。所提出的方法利用9位数字数据提供了14.5 nA的检测器电流分辨率，该分辨率对应于传统方法中使用的12位DAC的分辨率。

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