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首页> 外文会议>Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International >Reducing THD in an audio test instrument
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Reducing THD in an audio test instrument

机译：降低音频测试仪中的THD

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摘要

A patented instrument has been developed for measuring SNR, SINAD, and THD for DACs and ADCs. For DACs, a synthesized source bucks the sine-wave source being measured. For ADCs, the sine-wave source is the input to the ADC under test. The quality of the THD measurement is limited by the harmonics generated by the source (less than −120dB). A technique has been developed to further reduce harmonics from the source. The mathematics that is used to reduce the harmonics is described. A technique for measuring a source''s THD independent of the internal source purity is demonstrated. Experimental results demonstrate that spurs can be reduced to −140dB relative to the fundamental. The technique is also applicable to non-harmonic spurs. A simulation technique using equiripple polynomials was developed to evaluate the algorithms.
机译：已开发出一种专利仪器，用于测量DAC和ADC的SNR，SINAD和THD。对于DAC，合成源抵消了被测量的正弦波源。对于ADC，正弦波源是被测ADC的输入。 THD测量的质量受到信号源产生的谐波（小于-120dB）的限制。已经开发出一种技术，以进一步减少来自源的谐波。描述了用于减少谐波的数学。演示了一种独立于内部源纯度测量源THD的技术。实验结果表明，杂散信号可以相对于基波降低至-140dB。该技术也适用于非谐波杂散。开发了一种使用等波纹多项式的仿真技术来评估算法。

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