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Thermal Modeling and Experimental Validation of Heat Sink Design for Passive Cooling of BEOL IC Structures

机译:BEOL IC结构被动冷却散热器设计的热建模和实验验证

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Reducing the operating temperature of microelectronic devices is crucial for increasing reliability and extending lifetime. This study presents a proposed embedded heat sink design for passive cooling of BEOL interconnects and IC structures. Sample devices are fabricated and tested using thermoreflectance thermography to characterize the thermal response of the devices and assess the added cooling effects of the heat structures. An experimentally validated thermal model is built to analyse the thermal performance of the device and extract the thermal parameters of the structure.
机译:降低微电子设备的工作温度对于提高可靠性和延长使用寿命至关重要。这项研究提出了一种用于BEOL互连和IC结构的被动冷却的嵌入式散热器设计。使用热反射热成像技术制造并测试样品设备,以表征设备的热响应并评估热结构带来的额外冷却效果。建立了经过实验验证的热模型,以分析设备的热性能并提取结构的热参数。

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