Using of acoustic waves in X-ray topography of silicon crystals

机译：声波在硅晶体X射线形貌中的使用

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The influence of transverse ultrasonic wave parameters on the diffraction contrast forming on X-ray section topographs for microdefects and dislocations was investigated by the numerical solution of Takagi's equations system. The corresponding changes of integral characteristics of structural imperfections for real crystals were analysed also.

机译：通过Takagi方程组的数值解，研究了横向超声波参数对X射线断面形貌上衍射缺陷形成的微缺陷和位错的影响。还分析了真实晶体的结构缺陷的整体特征的相应变化。

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来源
《International Conference on Correlation Optics; 20030916-20030919; Chernivtsi; UA》|2003年|P.222-228|共7页
会议地点 Chernivtsi(UA)
作者
Novikov S.N.; Fedortsov D.G.; Dovganyuk V.V.;
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作者单位

Chernivtsi National University, 2 Kotsubynsky Str., Chernivtsi, 58012, Ukraine;

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原文格式 PDF
正文语种 eng
中图分类应用光学;
关键词
ultrasound; diffraction contrast; microdefects; section topographs; structural perfection of crystals;

机译：超声;衍射对比;微缺陷;截面形貌;晶体的结构完善;

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专利

1. ANALYSIS OF ACOUSTIC WAVE FIELDS IN La3Ga5SiO14 CRYSTALS USING X-RAY TOPOGRAPHY [J] . D. V. Roshchupkin, E. D. Roshchupkina, O. A. Buzanov, Bulletin of the Russian Academy of Sciences. Physics . 2005,第2期

机译：X射线断层扫描法分析La3Ga5SiO14晶体中的声波场。
2. X-ray diffraction from perfect silicon crystals distorted by surface acoustic waves [J] . Tucoulou R., Brunel M., Mathon O., Journal of Applied Crystallography . 2000,第4期

机译：表面声波扭曲的完美硅晶体的X射线衍射
3. Investigation of surface acoustic wave fields in silicon crystals by x-ray diffraction: A dynamical theory approach [J] . R. Tucoulou, O. Mathon, C. Ferrero, Journal of Applied Physics . 2005,第11期

机译：X射线衍射研究硅晶体中表面声波场的动力学理论方法
4. Using of acoustic waves in X-ray topography of silicon crystals [C] . Novikov S.N., Fedortsov D.G., Dovganyuk V.V., International Conference on Correlation Optics . 2004

机译：硅晶体X射线地形中的声波
5. Defects Analysis of Wide Bandgap Semiconductor Single Crystals via Synchrotron White Beam X-ray Topography [D] . Sun, Shun 2013

机译：同步加速器白束X射线形貌分析宽带隙半导体单晶的缺陷
6. Precise Manipulation and Patterning of Protein Crystals for Macromolecular Crystallography using Surface Acoustic Waves [O] . Feng Guo, Weijie Zhou, Peng Li, -1

机译：使用表面声波对高分子晶体进行精确操纵和蛋白质晶体构图
7. Synchrotron Radiation. IV. Study on Physical Property by Synchrotron Radiation. 6. Analysis of Lattice Distortion in As-grown Silicon Single Crystals by Plane-wave X-Ray Topography Using Imaging Plates. [O] . Yoshihiro KUDO 1998

机译：同步辐射。 IV。同步辐射的物理性质研究。 6.使用成像板通过平面波X射线形貌的生长硅单晶的晶格变形分析。
8. Microstrain Analysis in Bent Single Crystal Silicon by Double Crystal X-Ray Topography Technique [R] . Emamian, M. M. 1984

机译：双晶X射线形貌技术在弯曲单晶硅中的微应变分析

Using of acoustic waves in X-ray topography of silicon crystals

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