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首页> 外文会议>International Conference on Proceeding amp; Manufacturing of Advanced Materials; 20060704-08; Vancouver(CA) >Measuring and Modeling Grain, Grain Boundary and Grain Edge Average Curvature and their Application to Grain Growth
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Measuring and Modeling Grain, Grain Boundary and Grain Edge Average Curvature and their Application to Grain Growth

机译：晶粒，晶粒边界和晶粒边缘平均曲率的测量和建模及其在晶粒生长中的应用

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摘要

Alongside volume fraction, V_V, and area per unit of volume, S_V, the integral interface curvature per unit of volume, M_V, or the average interface curvature, H, are important microstructural descriptors. For grain growth, the grain boundary curvature is of special importance because, in addition to its geometrical significance, it is also the driving force for boundary migration. Notwithstanding its importance, curvature has been seldom measured and utilized in the analysis of polycrystals. Geometrical models were derived for the average curvature of individual grains, of grain boundaries and of grain edges, as a function of the mean intercept length. These models show good agreement with curvature measurements in an Al-1 mass%Mn alloy. Furthermore, this work shows how grain boundary curvature measurement can be applied to normal grain growth as well as to the effect of particles on grain boundary pinning.
机译：除了体积分数V_V和每单位体积的面积S_V之外，每单位体积的积分界面曲率M_V或平均界面曲率H是重要的微观结构描述子。对于晶粒长大，晶粒边界曲率特别重要，因为除了其几何意义外，它也是边界迁移的驱动力。尽管其重要性，但很少测量曲率并将其用于多晶分析。根据平均截距长度，得出了各个晶粒，晶粒边界和晶粒边缘的平均曲率的几何模型。这些模型与Al-1质量％Mn合金中的曲率测量结果显示出良好的一致性。此外，这项工作表明如何将晶界曲率测量应用于正常晶粒生长以及颗粒对晶界钉扎的影响。

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