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首页> 外文会议>International Conference on Processing amp; Manufacturing of Advanced Materials Pt.4; Jul 7-11, 2003; Leganes, Madrid, Spain >Isotopic exchange between gaseous hydrogen and scandium dideuteride thin films
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Isotopic exchange between gaseous hydrogen and scandium dideuteride thin films

机译：气态氢与二氘uter薄膜之间的同位素交换

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摘要

As part of a study to understand the long-term storage effects on scandium hydride thin films, an experiment has been conducted in which scandium dideuteride thin films were exposed to a hydrogen environment for various periods of time at ambient temperature. The resulting films were analysed using neutron reflectivity using the Surface Profile Analysis Reflectometer (SPEAR) at the Los Alamos Neutron Science Center. Using neutron reflectivity and taking advantage of the large difference in the neutron scattering lengths of hydrogen and deuterium, the resulting changes in the film composition due to isotopic exchange and diffusion were observed as a function of the film depth.
机译：作为了解对氢化scan薄膜的长期存储影响的研究的一部分，已进行了一项实验，其中将二氘二dium薄膜在环境温度下暴露于氢气环境中不同的时间。使用洛斯阿拉莫斯中子科学中心的表面轮廓分析反射仪（SPEAR），使用中子反射率分析所得薄膜。利用中子反射率并利用氢和氘的中子散射长度的巨大差异，观察到由于同位素交换和扩散导致的膜组成的变化与膜深度的关系。

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