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首页> 外文会议>International Symposium on State-of-the-Art Application of Surface and Interface Analysis Methods to Environmental Material Interactions: in Honor of James E.Castle's 65th Year, Mar 26-27, 2001, Washington D.C. >SYNTHESIS AND CHARACTERIZATION OF SELF-ASSEMBLED Cu_2O NANO-DOTS
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SYNTHESIS AND CHARACTERIZATION OF SELF-ASSEMBLED Cu_2O NANO-DOTS

机译：自组装Cu_2O纳米点的合成与表征

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摘要

Self-assembled Cu_2O nano-dots have been synthesized on single-crystal SrTiO)3 substrates using oxygen-plasma-assisted molecular beam epitaxy (OPA-MBE), and characterized using a number of different techniques including atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD), and scanning Auger microscopy (SAM). It was found that similar to conventional semiconductor systems the growth of Cu_2O nano-dots underwent shape/size transformations at different stages of growth. However, the transformations of Cu_2O/SrTiO_3 are more complex and involve no Cu_2O wetting layer at the SrTiO_3 surface, thus suggesting that the detailed mechanisms involved in shape/size transformations of Cu_2O/SrTiO_3 may differ from those of semiconductors.
机译：使用氧等离子体辅助分子束外延（OPA-MBE）在单晶SrTiO）3衬底上合成了自组装的Cu_2O纳米点，并使用多种不同的技术进行了表征，包括原子力显微镜（AFM），x射线光电子能谱（XPS），x射线衍射（XRD）和扫描俄歇显微镜（SAM）。发现与常规半导体系统相似，Cu_2O纳米点的生长在生长的不同阶段经历了形状/尺寸转变。然而，Cu_2O / SrTiO_3的转变更为复杂，并且在SrTiO_3表面上不包含Cu_2O润湿层，因此表明与Cu_2O / SrTiO_3的形状/尺寸转变有关的详细机理可能与半导体不同。

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