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Performance and Reliability of Quantum Cascade Lasers

机译:量子级联激光器的性能和可靠性

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We present the bum-in behavior and power stability of multiple quantum cascade lasers (QCLs) that were measured to investigate their long-term performance. For these experiments, the current to the QCL was cycled every ten minutes, and the output power was monitored over time for durations as long as two months. A small increase in power for a given injection current is observed for almost all of the QCLs tested during the bum-in period. Although the amount and duration of the burn-in varied among the devices tested, we observed that QCLs that operated with a lower threshold current exhibited a smaller bum-in change from initial conditions for the first ten hours of operation. This correlation, however, disappeared at longer operation times. The effect of packaging the QCLs is also investigated to determine its impact on performance and reliability. The power stability is measured for the packaged QCLs along with changes in the operational conditions. Although the temperature of the QCL is kept constant with a thermistor and thermoelectric cooler (TEC) inside the package, the case temperature is varied to monitor its correlation with any changes in power or frequency. Power changes and small frequency shifts are observed under these conditions. One possible explanation for these changes is the influence of optical feedback from the anti-reflection (AR) coated window in the package. The data from all of these experiments is presented.
机译:我们介绍了测量多个量子级联激光器(QCL)的老化行为和功率稳定性,以研究其长期性能。对于这些实验,每10分钟对QCL的电流进行一次循环,并随时间监视输出功率,持续时间长达两个月。在老化期间,几乎所有测试的QCL在给定的注入电流下都观察到功率的小幅增加。尽管老化的程度和持续时间在所测试的设备之间有所不同,但我们观察到以较低的阈值电流运行的QCL在运行的最初十小时内与初始条件相比,老化现象较小。但是,这种关联在更长的操作时间下消失了。还研究了包装QCL的影响,以确定其对性能和可靠性的影响。测量封装QCL的电源稳定性以及工作条件的变化。尽管QCL的温度通过封装内的热敏电阻和热电冷却器(TEC)保持恒定,但外壳温度却发生了变化,以监视其与功率或频率的任何变化的相关性。在这些条件下观察到功率变化和较小的频移。这些变化的一种可能解释是来自包装中防反射(AR)涂层窗口的光反馈的影响。提供了所有这些实验的数据。

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