首页> 外文会议>Materials science amp; technology 2011 conference amp; exhibition >Effect of High Temperature Aging on Microstructurual Evolution in AuSn Solder Joints
【24h】

Effect of High Temperature Aging on Microstructurual Evolution in AuSn Solder Joints

机译:高温时效对AuSn焊点组织演变的影响

获取原文
获取原文并翻译 | 示例

摘要

Eutectic AuSn solder is increasingly used in high temperature and high reliabilityrnapplications due to superior mechanical and thermal properties. These applications includernhybrid microelectronics, MEMS, high power laser diodes, optoelectronic devices andrncomponents packaging. Selection of appropriate device backside and substrate surfacernmetallization is critical for reliable soldering with AuSn, especially for high temperaturernapplication as diffusion accelerates at elevated temperature. A SiC die was used for die attachrnstudies on thick film metalized ceramic substrates. Two thick film metallurgies (Au and PtPdAu)rnwere evaluated. Aging and thermal cycling data are presented along with fracture surfacernanalysis after high temperature storage.
机译:由于优异的机械性能和热性能,共晶AuSn焊料越来越多地用于高温和高可靠性应用中。这些应用包括混合微电子,MEMS,高功率激光二极管,光电器件和组件封装。选择合适的器件背面和衬底表面金属化对于使用AuSn进行可靠的焊接至关重要,特别是对于高温应用,因为在高温下扩散会加速。 SiC芯片用于厚膜金属化陶瓷基板上的芯片附着研究。评价了两种厚膜冶金学(Au和PtPdAu)。高温存储后,将提供老化和热循环数据以及断裂表面分析。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号