首页> 外文会议>Mathematical Modelling for NDT >Electronic test solutions for FlowFET fluidic arrays
【24h】

Electronic test solutions for FlowFET fluidic arrays

机译:FlowFET流体阵列的电子测试解决方案

获取原文
获取原文并翻译 | 示例

摘要

The testable design and test of a software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control and interface electronics is presented. Test hardware is included for detecting faults in the DMOS electro-fluidic interface and the digital parts. Multi-domain fault modelling and simulation shows the effects of faults in the (combined) fluidic and electrical parts. Fault simulations also reveal important parameters of multi-domain test-stimuli for detecting both electrical and fluidic defects.
机译:介绍了软件控制的芯片实验室,包括FlowFET,控制和接口电子器件的流体阵列的可测试设计和测试。包含测试硬件,用于检测DMOS电流体接口和数字部件中的故障。多域故障建模和仿真显示了(组合)流体和电气部件中故障的影响。故障仿真还揭示了用于检测电和流体缺陷的多域测试刺激的重要参数。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号