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Timewise increases in contact resistance due to surface roughness and corrosion

机译：由于表面粗糙度和腐蚀，接触电阻会适时增加

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To understand failure and estimate connector reliability a connector model was made in which two mated rough copper surfaces were subjected to ingression and corrosive attack by atmospheric oxygen. The rough surface segments the connector contact area into many small discrete areas (a-spots) through which currents flow. The initial a-spot contact radii a/sub e/ (formed as metal-to-metal bridges by mating surface heights on the mating surfaces) was determined by the externally applied load, connector materials, geometry, and surface topography. Later, corrosive attack of the metallic surfaces cause the metallic contact radii to shrink and resistances to increase. Factors in the model that influence the corrosive process are environmental temperature, partial pressure of oxygen, and geometric factors associated with the contact. Resulting curves of contact resistance versus time are similar in trend and shape to experimentally measured curves by Takano and Mano. From time variations of contact resistance of the connector, methods for estimating the useful lifetime of electrical connectors are given.
机译：为了了解故障并评估连接器的可靠性，建立了一个连接器模型，其中两个配合的粗糙铜表面受到大气氧的侵入和腐蚀侵蚀。粗糙的表面将连接器的接触区域划分为许多小的离散区域（a点），电流流过这些离散区域。初始a点接触半径a / sub e /（由配合表面上的配合表面高度形成为金属-金属桥）由外部施加的载荷，连接器材料，几何形状和表面形貌决定。后来，金属表面的腐蚀侵蚀导致金属接触半径缩小，电阻增加。影响腐蚀过程的模型因素包括环境温度，氧气分压和与接触有关的几何因素。所得的接触电阻随时间变化的曲线在趋势和形状上与Takano和Mano通过实验测得的曲线相似。从连接器的接触电阻的时间变化出发，给出了用于估计电连接器的使用寿命的方法。

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