首页> 外文会议>ASME international mechanical engineering congress and exposition >Bias-dependent Peltier coefficient in bipolar devices
【24h】

Bias-dependent Peltier coefficient in bipolar devices

机译:双极设备中的偏置珀耳帖系数

获取原文

摘要

Temperature stabilization is important in many microelectronic devices due to thermal constraints on device operation and lifetime. The work described here is an investigation of thermoelectric phenomena in bipolar devices, specifically the p-n diode. Current injection can modify the Peltier coefficient at interfaces; this can give rise to thermoelectric cooling or heating depending on device parameters. The bias-dependent Peltier coefficient is modeled using self-consistent drift-diffusion, and implications for device design are examined. The different regimes of bias for which cooling is achieved are described, as well as the effects of device length, doping, and heterojunction band offset. Extensions of the model are given for applications such as the internal cooling of semiconductor laser diodes.
机译:由于设备操作和寿命的热约束,温度稳定在许多微电子器件中是重要的。这里描述的工作是对双极器件中热电现象的研究,特别是P-N二极管。电流注入可以在接口处修改Peltier系数;这可能会导致热电冷却或加热,这取决于器件参数。使用自我漂移扩散模拟偏置依赖的珀耳帖系数,并检查用于器件设计的影响。描述了实现冷却的不同偏置制度,以及器件长度,掺杂和异质结带偏移的效果。给出了模型的延伸,以用于诸如半导体激光二极管的内部冷却的应用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号