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Two-Step Probe Calibration to Determine Electrostatic Charge on Dielectric Surfaces

机译:两步探针校准,确定介电表面上的静电荷

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Capacitive probe is widely employed to measure the electrostatic charge on dielectric surfaces. What it records is actually an induced voltage, which needs to be calibrated to represent the surface charge density. The available calibration method needs to operate the probe and to prepare the sample in such a way that the fields are homogenous at both sides of the dielectric surface. This has been well applied to the measurements at thin films.
机译:电容式探头广泛用于测量介电表面上的静电荷。它记录的实际上是一个感应电压,需要对其进行校准以表示表面电荷密度。可用的校准方法需要操作探针并以使电场在电介质表面的两侧均匀的方式制备样品。这已很好地应用于薄膜的测量。

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