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DEVELOPMENT OF A RANDOM-WALK ALGORITHM FOR IC-INTERCONNECT ANAYSIS: 2D TE Benchmarks, Materially Heterogeneous Domains

机译:IC互连分析的随机游走算法的开发:2D TE基准测试,实质异构域

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Fundamentally, the electrical properties of advanced multilevel IC interconnects must be described with Maxwell's equations. We have created an entirely new numerical floating RW (Random-Walk) algorithm for wave-equation solution. Previously, we have reported the successful testing of a 1D TEM RW algorithm, and a subsequent extension for 2D TE propagation in materially homogeneous domains. We report here, another important extension: 2D TE propagation in materially heterogeneous domains. The challenge of deriving simple, analytical surface Green's functions has again been met with iterative perturbation theory. Split-conductor and shielded-wire benchmark test problems yielded numerical-error magnitudes on the order of 5 X 10~(-3), within a computed (normalized) solution range [0.0, 0.0i] through [1.0, -0.2i]. Operation frequency was 1.0GHz, and problem feature sizes were 1-10μm.
机译:从根本上讲,必须使用麦克斯韦方程来描述高级多级IC互连的电气特性。我们为波方程解决方案创建了一种全新的数值浮动RW(Random-Walk)算法。先前,我们已经报道了1D TEM RW算法的成功测试,以及随后在材料同质域中2D TE传播的扩展。我们在这里报告了另一个重要的扩展:二维TE在材料异质域中的传播。迭代扰动理论再次满足了推导简单的分析表面格林函数的挑战。在计算的(规范化)解决方案范围[0.0,0.0i]至[1.0,-0.2i]中,分导体和屏蔽线基准测试问题产生的数值误差幅度为5 X 10〜(-3)量级。 。工作频率为1.0GHz,问题特征尺寸为1-10μm。

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