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On the determination of the stray field structure by magnetic force microscopy (MFM)

机译：用磁力显微镜（MFM）确定杂散场结构

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摘要

In this paper the influence of work parameter of magnetic force microscopy (MFM) on the magnetic contrast of the stray field measured in soft magnetic amorphous Fe-based ribbons using two-pass technique has been analyzed. It was proved that an increase in ΔZ separation of sample-tip during the second scan affects considerably the quality, contrast of obtained micrograph of the stray field image. Increase in ΔZ causes smaller interaction between the cantilever's tip and tested field. It is caused by smaller influence of the source field emitted from the sample on the magnetic tip. Deterioration and contrast's broadening of obtained pictures allows to analyse and detect the areas which have positive as well as negative magnetisation.
机译：本文分析了磁力显微镜（MFM）的工作参数对软磁无定形铁基铁基带中通过两次通过技术测量的杂散磁场的磁对比度的影响。事实证明，在第二次扫描过程中，样品尖端的ΔZ间隔增加会大大影响所获得的杂散场图像显微照片的质量和对比度。 ΔZ的增加会导致悬臂尖端与测试场之间的相互作用变小。这是由于样品从磁头上发出的源场的影响较小所致。所获得图像的劣化和对比度的扩大使得可以分析和检测具有正磁化和负磁化的区域。

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