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INVESTIGATION OF CuInS_2/In_2S_3 INTERFACE AND RELATED CELLS

机译:CuInS_2 / In_2S_3接口及相关细胞的研究

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The present study deals with the investigation of the CuInS_2/In_2S_3 interface and related devices. Theabsorbers used here were grown by electrodeposition (EL) whereas the indium sulphide buffer layers were coevaporated(PVD). It is observed that during the (PVD)In_2S_3 deposition, copper atoms diffuse from the absorber intothe buffer layer resulting in the formation of a copper depleted absorber surface. Such a surface modification isassumed to be dramatic for the solar cell performance. The fact that avoiding the copper diffusion by the addition ofsodium during the buffer layer growth results in much higher efficiency devices strengthens this assumption.
机译:本研究涉及对CuInS_2 / In_2S_3接口和相关设备的研究。这 此处使用的吸收剂通过电沉积(EL)生长,而硫化铟缓冲层被共蒸发 (PVD)。观察到在(PVD)In_2S_3沉积期间,铜原子从吸收体扩散到 缓冲层导致形成耗尽铜的吸收体表面。这样的表面改性是 被认为对太阳能电池的性能影响很大。通过添加铜来避免铜扩散的事实 缓冲层生长过程中的钠导致更高效率的器件强化了这一假设。

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