Precise characterization of the spectral response (SR) of the series connected PV devices such as themodules and multi-junction devices are investigated. The SR measurement of series-connected PV devices showmore complicated features than that of single-junction cells, since multiple component cells are series-connected inone device. The SR of multi-junction devices is discussed, in conjunction with the measurement conditions such asthe intensity and spectrum of the color bias light, as well as the shape of the I-V curves. As the cells in PV modulesare also series connected, measured and "true" spectral response of each constituent cell have similar relations withthe multi-junction cells. Various factors to affect the SR measurement of the modules are also discussed.Measurement conditions to yield accurate spectral response results are discussed. Measurement of the SR's ofcommercial-size modules are demonstrated for various kinds of modules including crystalline Si, thin-film Si, andmulti-junction structures.
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