首页> 外文会议>International Symposium on Advanced Optical Manufacturing and Testing Technologies; 20070708-12; Chengdu(CN) >Study on Voltage Biasing Technique for Spectral Response Measurement of Multi-Junction Solar Cell
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Study on Voltage Biasing Technique for Spectral Response Measurement of Multi-Junction Solar Cell

机译:多结太阳能电池光谱响应测量的偏压技术研究

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Multi-junction solar cell (MJ) has been paid more attention for space and terrestrial concentrator system applications because of more efficiency has achieved. The spectral response (SR) of MJ is an important characteristic for technique optimization or performance evaluation. Measurement of SR of MJ cell is quite more difficult than that of single-junction solar cell (SJ) because a complicated light biasing and voltage biasing system is needed. The object to be tested is GaInP/Ga(In)As/Ge triple-junction monolithic cells, and Ge bottom subcell with non-ideal properties would suffer from measurement error by improper voltage biasing.. Since monolithic MJ cell without any middle taps, the internal characteristic is inaccessible, so the external biasing voltage usually obtained by estimating.. It is well known that the characteristic of semi-conductor device has wide variance range, so significant deviation is often observed by a fixed estimating value. The paper proposes a method which could access the internal characteristic of MJ indirectly based on measuring other than estimating or mathematics model, and it has been proven by experiment with two SJ component cells, Ga(In)As cell and Ge cell.
机译:由于实现了更高的效率,多结太阳能电池(MJ)已在空间和地面集中器系统应用中得到了更多关注。 MJ的光谱响应(SR)是技术优化或性能评估的重要特征。 MJ电池的SR的测量比单结太阳能电池(SJ)的测量要困难得多,因为需要复杂的光偏置和电压偏置系统。要测试的对象是GaInP / Ga(In)As / Ge三结单片电池,具有不理想特性的Ge底部子电池将因不正确的电压偏置而遭受测量误差。由于没有任何中间抽头的单片MJ电池,众所周知,半导体器件的特性具有宽泛的变化范围,因此通过固定的估算值通常会观察到明显的偏差。提出了一种基于测量而不是估计或数学模型的间接访问MJ内部特性的方法,并已通过对两个SJ组成单元Ga(In)As单元和Ge单元的实验证明。

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