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首页> 外文会议>Electronics Division Meeting of the Ceramic Society of Japan >Microstructures and microwave dielectric properties on annealed Al_2O_3-TiO_2 composite ceramics
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Microstructures and microwave dielectric properties on annealed Al_2O_3-TiO_2 composite ceramics

机译：退火al_2O_3-TiO_2复合陶瓷上的微结构和微波介电性能

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摘要

The large negative temperature coefficient of resonant frequency (τ_f) of Al_2O_3 is a problem' for applicable microwave/millimeter wave dielectrics. A Previous study reported that the τ_f was improved by sintering with TiO_2 and then annealing, where the annealing decompose the secondary phase of Al_2TiO_5. This study investigated the hold time of annealing. The Quality factor (Qf) value decreased when the sample was annealed at 1100°C for 2hrs. While Al_2TiO_5 was not detected by X-ray powder diffraction, it was located around TiO_2 by scanning transmission electron microscopy equipped with energy dispersive X-ray spectroscopy. It should be considered that the degradation of the Qf was caused by the existence of noncrystalline Al_2TiO_5 and new boundaries between noncrystalline Al_2TiO_5 and TiO_2.
机译：AL_2O_3的谐振频率（τ_f）的大负温度系数是适用的微波/毫米波电介质的问题。先前的研究报道说，通过用TiO_2烧结，然后退火改善τ_f，其中退火分解Al_2tio_5的二次相。本研究调查了退火的保持时间。当样品在1100℃下退火2小时时，质量因子（QF）值降低。虽然X射线粉末衍射未检测到Al_2TiO_5，但通过扫描配备有能量分散X射线光谱的透射电子显微镜，它位于TiO_2周围。应该认为QF的降解是由非晶体Al_2TiO_5的存在引起的，无晶al_2tio_5和TiO_2之间的新边界。

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