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The study on the parameters change of electronic components under long-term storage conditions by accelerated test

机译:通过加速试验研究长期储存条件下电子元件的参数变化

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In this paper, a test method of accelerated stress through temperature and humidity was designed. For the 3DK10 NPN transistors of package with and without painting, the life test was continuous for 115 hours under 125°C and 95% humidity. In the result, the parameters of all transistors are not obviously changed, at the same time, we found the package painting is strong hygroscopic which has a large effect on the reliability of the devices in high humidity. At last, we compared the parameters of the transistors between the new transistors and ones in storage for over thirty years, the result was described, after long-term storage the output characteristics degrade, the gain of some devices decreases and the gain of some of them increases.
机译:本文设计了一种通过温度和湿度加速应力的测试方法。对于带有和不带有油漆的3DK10 NPN晶体管封装,在125°C和95%的湿度下,寿命测试可以连续进行115小时。结果,所有晶体管的参数没有明显改变,同时,我们发现封装漆具有很强的吸湿性,这对高湿度下的器件可靠性有很大的影响。最后,我们比较了新晶体管和已存储30年以上的晶体管的参数,对结果进行了描述,长期存储后,输出特性下降,某些器件的增益降低,​​某些器件的增益降低。他们增加。

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