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首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >ANNUAL DEGRADATION RATES OF BULK CLYSTALLINE SILLICON PV MODULES ESTIMATED FROM INDOOR AND OUTDOOR MEASUREMENTS
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ANNUAL DEGRADATION RATES OF BULK CLYSTALLINE SILLICON PV MODULES ESTIMATED FROM INDOOR AND OUTDOOR MEASUREMENTS

机译：室内和室外测量估计的批量晶体硅PV模块的年退化率

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The global cumulative solar PV installations reached nearly 200 GW by the end of 2014. Therefore, the investigation of long-term durability of PV systems is much important. The National Institute of Advanced Industrial Science and Technology (AIST) has measured the outdoor performance from eight kinds (15 types) of PV arrays in AIST Kyushu Center. In this study, we focus on bulk crystalline silicon (c-Si) PV modules, because the market share of bulk c-Si technologies is more than 90% in 2014. We evaluate the annual degradation rates of the performance of the PV modules by two methods. One method is estimated from the average or total power outputs of all installed c-Si PV modules, which are measured by a solar simulator once a year. The other method is based on I-V curves of the PV arrays, which have been measured by I-V curve tracers for outdoor usage every ten minutes since the start of 2013. Both the results based on the indoor and outdoor measurements show that the degradation rates of the ordinal p-type c-Si PV modules are quite low, although those of the high-efficiency n-type c-Si PV modules tend to be high. In recent years, new processes, which enhance PV cell efficiencies such as MWT (Metal Wrap Through) and PERC (Passivated Emitter Rear Cell) technologies, are adopted into commercial PV modules. Therefore, the durability and reliability of the PV modules with new processes should be investigated by both acceleration tests and actual outdoor operation.
机译：全球累计太阳能光伏设备截至2014年底达到近200年的GW。因此，对光伏系统的长期耐久性的调查非常重要。国家先进的工业科学和技术研究所（AIST）已经测量了艾克苏河村八种（15种）PV阵列的户外性能。在这项研究中，我们专注于散装晶体硅（C-Si）光伏模块，因为批量C-Si技术的市场份额在2014年超过90％。我们评估了PV模块性能的年度退化率两种方法。从所有安装的C-Si PV模块的平均值或总功率输出估计了一种方法，该模拟器每年由太阳模拟器测量一次。另一种方法基于PV阵列的IV曲线，该曲线由IV曲线示踪剂进行测量，自2013年初以来每十分钟为室外使用。基于室内和室外测量的结果表明序数P型C-Si PV模块非常低，尽管高效N型C-Si PV模块的趋势趋于高。近年来，采用新的方法，增强了MWT（金属包装通过）和PERC（钝化发射器后电池）技术等PV细胞效率。因此，应通过加速试验和实际户外操作来研究具有新工艺的光伏模块的耐用性和可靠性。

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