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首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >CAPTURING CHARGE TRANSFER DYNAMICS WITH ULTRAFAST TIME-RESOLVED XUV PHOTOELECTRON SPECTROSCOPY AT DYE - SEMICONDUCTOR INTERFACES
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CAPTURING CHARGE TRANSFER DYNAMICS WITH ULTRAFAST TIME-RESOLVED XUV PHOTOELECTRON SPECTROSCOPY AT DYE - SEMICONDUCTOR INTERFACES

机译：用超快时间分辨XUV光电子能谱捕获电荷转移动态在染料 - 半导体界面

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摘要

The ultrafast heterogeneous electron transfer at the interface between the N719 ruthenium dye complex and TiO_2 is studied by means of ultrafast XUV photoemission spectroscopy. After optical excitation of the system by a laser pulse of 530nm wavelength, XUV light obtained from high-order harmonic generation is utilized to probe the electron density distribution of the involved ground and excited states at the interface. By using a spectral decomposition of the transient emission signal we identified for the first time directly the absolute binding energies of the dye singlet and triplet metal-to-ligand charge-transfer states. The advantage of studying simultaneously injection kinetics and the electronic band alignment will be discussed and an outlook for future applications of this method in view of other promising energy related materials will be presented.
机译：通过超薄XUV光学激发光谱研究了N719钌染料复合物和TiO_2之间的界面处的超快异质电子传递。在通过激光脉冲的530nm波长的激光脉冲的光学激发之后，利用从高阶谐波生成获得的XUV光探测界面处所涉及的地面和激发状态的电子密度分布。通过使用首次鉴定的瞬态发射信号的光谱分解，直接鉴定染料态态的绝对结合能和三态金属与配体电荷转移状态。将讨论同时注射动力学和电子带对准的优点，并且鉴于其他有前途的能量相关材料，呈现该方法的未来应用的前景。

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