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首页> 外文会议>European Photovoltaic Solar Energy Conference and Exhibition >HIGHLY ACCELERATED THERMAL CYCLING TEST FOR SHORT TERM EXAMINATION OF PHOTOVOLTAIC MODULE RELIABILITY
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HIGHLY ACCELERATED THERMAL CYCLING TEST FOR SHORT TERM EXAMINATION OF PHOTOVOLTAIC MODULE RELIABILITY

机译：高加速热循环试验，用于光伏模块可靠性的短期检查

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摘要

We have developed a highly accelerated thermal cycling (HATC) test. As previously reported, we have improved a thermal cycling (TC) test to shorten testing time by increasing the number of TC per unit time in addition to light irradiation. In this study, we investigated further enhancement of stress to reduce testing time for the TC test. From an analysis by using the Eyring model, we found that the temperature difference, AT, largely affects the acceleration of TC testing. An effect of AT was confirmed by performing an HATC test with AT of 165°C. The result showed that the HATC test degraded a PV module nearly five times faster than by the simple repetition of a TC test in accordance with International Electrotechnical Commission (IEC) qualifications. No acceleration effect was confirmed through examination of light irradiation stress.
机译：我们开发了一种高度加速的热循环（HATC）测试。如前所述，我们改进了热循环（TC）测试以通过增加光照照射除了每单位时间的TC的数量来缩短测试时间。在这项研究中，我们研究了进一步提高压力以减少TC测试的测试时间。通过使用Eyping模型的分析，我们发现温度差异，在很大程度上影响了TC测试的加速度。通过在165℃下进行HATC测试来确认AT的效果。结果表明，根据国际电工委员会（IEC）资格，HATC测试近五倍降低了PV模块比简单重复TC测试。通过检测光照射应力，无需加速效应。

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