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Microwave Synthesis of Nano SiC Doping Mg(B_(1-2x)(SiC)_x)_2 Superconductor and Superconductivity

机译:微波合成纳米SiC掺杂Mg(B_(1-2x)(SiC)_x)_2超导体和超导电性

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Superconductor samples Mg(B_(1-2x)(SiC)_x)_2 (x=0,5%, 10%) are synthesized from nano SiC, Mg and amorphous boron powders by microwave direct synthesis in a short time. Powder X-ray diffraction (XRD) analysis indicates that the phases of the synthesis sample are MgB_2 (major phase) and a small amount of MgO and Mg_2Si. The main peaks of MgB_2, (100), (101), (002) and (110) are shift to the higher diffraction angle position and the width of half height of the diffraction plane is broaden for the SiC doping Mg(B_(1-2x)(SiC)_x)_2, which show that the B positions of MgB_2 are partly substituted and the grains of MgB_2 are fine. Scanning electron microscope (SEM) observation shows that the MgB_2 grain size is very small and the sample is tightness (compact). The onset superconducting transition temperature of the Mg(B_(1-2x)(SiC)_x)_2 (x=0,5%, 10%) samples measured by magnetization measurement are about 37.6 K, 37.0 K, 36.8 K respectively. The critical current density J_c are calculated according to the Bean model from the magnetization hysteresis loop of the slab Mg(B_(1-2x)(SiC)_x)_2 (x=0, 5%, 10%) samples. The critical current density J_c of nano SiC doping Mg(B_(1-2x)(SiC)_x)_2 samples are greatly enhanced. In higher external magnetic field, the J_c of 10% SiC doped sample is the highest; in lower external magnetic field, the J_c of 5% SiC doped sample is the highest; while in the whole external magnetic field, the J_c of undoped sample is the lowest.
机译:纳米SiC,Mg和非晶态硼粉通过微波直接合成在短时间内合成了超导体样品Mg(B_(1-2x)(SiC)_x)_2(x = 0,5%,10%)。粉末X射线衍射(XRD)分析表明,合成样品的相为MgB_2(主相)和少量的MgO和Mg_2Si。 MgB_2,(100),(101),(002)和(110)的主峰向SiC掺杂Mg(B_(1 -2x)(SiC)_x)_2,表明MgB_2的B位置被部分取代,并且MgB_2的晶粒细小。扫描电子显微镜(SEM)观察表明,MgB_2晶粒非常小,并且样品致密(紧凑)。通过磁化测量测得的Mg(B_(1-2x)(SiC)_x)_2(x = 0,5%,10%)样品的开始超导转变温度分别约为37.6 K,37.0 K和36.8K。根据Bean模型,从平板Mg(B_(1-2x)(SiC)_x)_2(x = 0、5%,10%)样品的磁化磁滞回线计算出临界电流密度J_c。纳米SiC掺杂Mg(B_(1-2x)(SiC)_x)_2样品的临界电流密度J_c大大提高。在较高的外部磁场中,掺杂10%SiC的样品的J_c最高;在较低的外部磁场中,掺杂5%SiC的样品的J_c最高;而在整个外部磁场中,未掺杂样品的J_c最低。

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