TRINANO N100 3D MEASUREMENTS WITH NANOMETER REPEATABILITY AND EFFECTS OF PROBE-SURFACE INTERACTION

机译：具有纳米重复性的TRINANO N100 3D测量和探针-表面相互作用的影响

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A novel CMM has been developed and manufactured. Its design allows nanometer uncertainty, while greatly reducing manufacturing costs.Initial verification measurements show a standard deviation in single point repeatability of 2.4 nm. The standard deviation in the distance measurement between 2 gauge blocks is measured to be 4.1 nm.

机译：已经开发和制造了一种新型的三坐标测量机。其设计允许纳米不确定性，同时大大降低了制造成本。初步验证测量表明，单点重复性的标准偏差为2.4 nm。 2个量块之间的距离测量的标准偏差为4.1 nm。

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《Annual meeting of the American Society for Precision Engineering》|2012年|85-88|共4页
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Edwin J.C. Bos; A.J.M. Moers; M.C.J.M. van Riel;
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1. RECOGNITION OF PROTEIN ADSORPTION ONTO POLYMER SURFACES BY SCANNING FORCE MICROSCOPY AND PROBE-SURFACE ADHESION MEASUREMENTS WITH PROTEIN-COATED PROBES [J] . Chen X., Roberts CJ., Tendler SJB., Langmuir: The ACS Journal of Surfaces and Colloids . 1997,第15期

机译：通过扫描力显微镜和涂有蛋白质的探针对探针表面的粘附测量，识别在表面上的蛋白质吸附
2. Investigating the applicability of inverse gas chromatography to binary powdered systems: An application of surface heterogeneity profiles to understanding preferential probe-surface interactions [J] . GambleJ.F., DavéR.N., KiangS., International Journal of Pharmaceutics . 2013,第1a2期

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机译：研究反相气相色谱法对二元粉末系统的适用性：表面异质性分布在理解优先探针-表面相互作用中的应用
4. TRINANO N100 3D MEASUREMENTS WITH NANOMETER REPEATABILITY AND EFFECTS OF PROBE-SURFACE INTERACTION [C] . Edwin J. C. Bos, A. J. M. Moers, M. C. J. M. van Riel ASPE Annual Meeting . 2012

机译：Trinano N100具有纳米重复性的3D测量和探针表面相互作用的影响
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TRINANO N100 3D MEASUREMENTS WITH NANOMETER REPEATABILITY AND EFFECTS OF PROBE-SURFACE INTERACTION

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