首页> 外文会议>IEEE International Conference on Nanotechnology >Silicon nanowire devices with widths below 5 nm
【24h】

Silicon nanowire devices with widths below 5 nm

机译:硅纳米线装置,宽度低于5 nm

获取原文

摘要

This paper describes a robust process for the fabrication of highly doped Silicon-On-Insulator nanowires and devices. The process uses electron-beam lithography, lowdamage dry etch and controlled thermal oxidation to deliver consistent, reproducible and reliably nanowires of nominal widths from 100 nm down to sub-5 nm etched to a depth of 55 nm in silicon. Initial electrical measurements indicate metallic behavior for the widest wires and below a particular width, the wires become depleted showing electrical behaviour consistent with Coulomb blockade at room temperature.
机译:本文介绍了制造高掺杂的绝缘体纳米线和装置的稳健方法。该方法采用电子束光刻,低峰值干蚀刻和受控的热氧化,以从100nm到沉积到55nm的深度为55nm的副5nm的标称宽度的一致性,可再现和可靠的纳米线。初始电测量表示最宽导线和低于特定宽度的金属行为,导线耗尽,显示与室温下与库仑封锁一致的电动行为。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号