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SEL and cell failures in MRAM under ion and focused laser irradiation

机译:在离子和聚焦激光照射下MRAM中的SEL和细胞故障

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摘要

MRAM cell permanent failures was observed along with SEL under laser and ion beam irradiation. Sample preparation for back side was proposed to safe MRAM functionality and to allow focused laser irradiation though the substrate of MRAM die.
机译:在激光和离子束照射下,观察到MRAM细胞永久性故障。背侧的样品制备被提出为安全MRAM官能度,并允许聚焦激光照射,尽管MRAM模具的基材。

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