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Domain of validity of the equation for total integrated scatter (TIS)

机译：总集成散射方程的有效性域（TIS）

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The analytical expression for total integrated scatter (defined as diffuse reflectance divided by total reflectance) has been around for almost six decadesiTIS/i = 1 - expstrong[/strong-(4π cosθisubi/sub/i σ/λ)sup2/supstrong]/strong.Most surface scatter analysts now realize that the expression is ambiguous unless spatial frequency band-limits are specified for the rms roughness, σ, in the expression. However, there still exists uncertainty about the domain of validity of the expression with regard to both surface characteristics and incident angle. In this paper we will quantitatively illustrate this domain of validity for both Gaussian and fractal one-dimensional surfaces as determined by the rigorous integral equation method (method of moments) of electromagnetic theory. Two dimensional error maps will be used to illustrate the domain of validity as a function of surface characteristics and incident angle. Graphical illustrations comparing the TIS predictions of several approximate surface scatter theories will also be presented.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译：总体整体散射的分析表达（定义为漫反射率除以总反射率）已经存在近六十年的近六十年来 = 1 - Exp > [ - （4＆pi; cos＆theta; i ＆sigma; /＆lambda;） 2 >] 。最多的表面散射分析师现在意识到表达是模棱两可的在表达式中指定了空间频带限制，为rms粗糙度，＆sigma;。然而，关于表面特性和入射角的表达式的有效领域仍然存在不确定性。在本文中，我们将定量地示出了通过电磁理论的严格整体方程方法（方法）确定的高斯和分形一维表面的有效性的该领域。将使用二维错误映射来说明作为表面特性和入射角的函数的有效域。比较若干近似表面散射理论的TIS预测的图形插图也将被呈现。©（2012）照片光学仪表工程师的版权协会（SPIE）。仅供个人使用的摘要下载。

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