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Reliability optimization of electronics module by derating using genetic algorithm

机译：通过遗传算法降额来优化电子模块的可靠性

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This paper explores new way of achieving targeted reliability of any electronics module by a practice of derating. Derating is most promising and efficient technique of improving reliability of any electronics module as it replaces overstressed electronics components with under stressed components without unnecessarily increasing complexity and weight of the module. Derating practice combine with genetic optimization technique is used on a full bridge converter circuit for attaining targeted reliability in minimum possible cost. In a proposed simulated electronics module, all sort of stress factors (Voltage stress factor, Current stress factor, power stress factor and temperature stress factor) applied on components of a simulated module has been factored in. Reliability optimization problems involve a complex method of selection of components with multiple choices that produces desired result. A Genetic Algorithm method has been applied on Full Bridge Converter Circuit to demonstrate its usefulness and efficiency in achieving set reliability in minimum cost. This proposed method is more promising and efficient than the other methods of reliability optimization such as redundancy allocation as it does not increase the overall complexity and weight of the system.
机译：本文探讨了通过降额实践来实现任何电子模块的目标可靠性的新方法。降额是提高任何电子模块可靠性的最有前途和最有效的技术，因为它可以用过应力的组件代替过应力的电子组件，而不会不必要地增加模块的复杂性和重量。在全桥式转换器电路上使用降额实践与遗传优化技术相结合，以尽可能降低成本实现目标可靠性。在拟议的仿真电子模块中，已考虑了应用于仿真模块组件的各种应力因子（电压应力因子，电流应力因子，功率应力因子和温度应力因子）。可靠性优化问题涉及复杂的选择方法具有多种选择的组件可产生理想的结果。遗传算法方法已应用于全桥换流器电路，以证明其在最小成本下实现设定可靠性的有用性和效率。该提议的方法比其他可靠性优化方法（例如冗余分配）更具希望和效率，因为它不会增加系统的整体复杂性和重量。

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