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1/f Noise in Single-Walled Carbon Nanotube Films

机译:单壁碳纳米管薄膜的1 / f噪声

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We use Monte Carlo simulations and modeling to study the 1/f noise in CNT films as a function of device parameters and film resistivity. We consider noise sources due to both tube-tube junctions and nanotubes themselves. By comparing the simulation results with experimental data, we find that the noise generated by tube-tube junctions dominates the total CNT film 1/f noise. We then systematically study the effect of device length, device width and film thickness on the 1/f noise scaling in CNT films. Our results show that the noise amplitude depends strongly on device dimensions and on the film resistivity, following a power-law relationship near the percolation threshold. Despite its relative simplicity, our computational approach explains the experimentally observed 1/f noise scaling in CNT films. Since 1/f noise is a more sensitive measure of percolation than resistivity, these simulations will help improve the performance of CNT film sensors at the micro-nano interface, where noise is an important figure of merit.
机译:我们使用蒙特卡洛模拟和建模来研究CNT薄膜中的1 / f噪声与器件参数和薄膜电阻率的关系。我们考虑由于管-管结和纳米管本身引起的噪声源。通过将模拟结果与实验数据进行比较,我们发现由管-管结产生的噪声占总CNT膜1 / f噪声的主导。然后,我们系统地研究器件长度,器件宽度和膜厚度对CNT膜中1 / f噪声标度的影响。我们的结果表明,在接近渗透阈值附近的幂律关系之后,噪声幅度很大程度上取决于器件尺寸和薄膜电阻率。尽管它相对简单,但是我们的计算方法还是解释了实验观察到的CNT膜中的1 / f噪声缩放。由于1 / f噪声是比电阻率更敏感的渗滤量度,因此这些仿真将有助于改善微纳界面上的CNT薄膜传感器的性能,在微纳界面上,噪声是重要的品质因数。

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