Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs

机译：用于选择用于超短EMPS的电子设备模拟器的方法的方法原理

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Shortcomings of the standard ways for tests of electronic devices for immunity to ultrashort electromagnetic pulses (US EMPs) are considered. The method of a choice of simulators being based on use of key parameters of the pulse electric disturbances induced in critical circuits of equipment is offered. This method allows choosing the simulator or some simulators providing the most severe conditions of tests.

机译：考虑了用于超短电磁脉冲（US EMPs）的电子设备测试标准方法的缺点。提供了基于在设备的临界电路中诱导的脉冲电阻的关键参数的应用的选择方法。此方法允许选择模拟器或某些模拟器，提供最严重的测试条件。

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《Asia-Pacific International Symposium on Electromagnetic Compatibility》|2016年|1 v.|共3页
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Yury V. Parfenov; Leonid N. Zdoukhov; Vladimir M. Chepelev; Boris A. Titov; William A. Radasky;
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中图分类结构;
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Electric breakdown;

机译：电击;

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1. Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP [J] . Chepelev Vladimir, Parfenov Yury, Radasky William, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2018,第5期

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2. Electronic Invasive Blood Pressure Simulator Device for Patient Monitor Testing [J] . J. Kijonka, M. Penhaker Electronics and Electrical Engineering . 2012,第6a122期

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3. Electronic Invasive Blood Pressure Simulator Device for Patient Monitor Testing [J] . J. Kijonka, M. Penhaker Electronics and Electrical Engineering . 2012,第6a122期

机译：用于患者监控测试的电子侵入血压模拟器装置
4. Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs [C] . Yury V. Parfenov, Leonid N. Zdoukhov, Vladimir M. Chepelev, Asia-Pacific International Symposium on Electromagnetic Compatibility . 2016

机译：选择用于电子设备测试超短EMP的模拟器的方法性原则
5. Inelastic Electron Tunneling Spectroscopy in Molecular Electronic Devices from First-Principles. [D] . Ji, Tao. 2011

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8. Consumer Electronics Testing to Fast-Rise EMP (Electromagnetic Pulse) (VEMPS (Vertical Electromagnetic Pulse Simulator) II Development) [R] . Ellis, V. J. 1989

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Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs

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