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Carbon nanotube enhanced CMOS interconnect

机译:碳纳米管增强型CMOS互连

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This paper describes the potential of using carbon nanotube (CNT) as a via-filling material to enhance the performance mainstream CMOS technology. Due to the CMOS compatibility constraint, the choice of catalyst material and processing conditions have been significantly limited. After a careful selection process, Ni is found to be a workable material. Through catalyst engineering, we have demonstrated that it is possible to form CNT filled vias on metal or silicide substrate at low temperature with low contact resistance. The impact of via dimensions and processing condition has also been studied. Based on statistical analysis using measured data, the best-case projected via resistance for a 30nm via is 295Ω, which is within one order of magnitude of its copper and tungsten counterparts.
机译:本文介绍了使用碳纳米管(CNT)作为通孔填充材料来增强主流CMOS技术性能的潜力。由于CMOS兼容性的限制,催化剂材料和工艺条件的选择受到了很大的限制。经过仔细的选择过程,发现镍是一种可行的材料。通过催化剂工程,我们已经证明可以在低温下以低接触电阻在金属或硅化物衬底上形成CNT填充通孔。还研究了通孔尺寸和加工条件的影响。根据使用测量数据的统计分析,对于30nm通孔,最佳情况下的通孔电阻预测值为295Ω,这是其铜和钨对应物的一个数量级。

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