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Surface temperature measurement of transversal magnetic field contacts using a thermography camera

机译：使用热像仪测量横向磁场触点的表面温度

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Some vacuum interrupters (VI) are equipped with transversal magnetic field (TMF) contacts. A transversal directed Lorentz force makes the arc move circularly. The local surface temperature of the arc root is usually above the melting point at high current, which can be measured using a high-speed thermography camera. For this purpose, the emissivity of the contact material must be known. For Cu, we determined emissivity at εliq = 0.053 (liquid) and εsol = 0.035 (solid) for a spectral wavelength range of 1.5 μm-1.7 μm. A switching test was performed using spiral contacts (CuCr 75/25) with a diameter of 68 mm and a 50 Hz half-wave sinusoidal current of 19 kA (RMS). The temperature of an anode spot was examined using the thermography camera. We assumed emissivity at 0.3, with an anode spot temperature of up to 2650 K during the heating phase. During the cooling phase the temperature decreased after 0.55 ms at 2118 K and after 1.10 ms at 1863 K.
机译：一些真空灭弧室（VI）配备了横向磁场（TMF）触点。横向方向的洛伦兹力使弧线圆周运动。电弧根的局部表面温度通常在高电流下高于熔点，可以使用高速热像仪进行测量。为此，必须知道接触材料的发射率。对于Cu，我们确定了在1.5μm-1.7μm的光谱波长范围内，εliq= 0.053（液体）和εsol= 0.035（固体）的发射率。使用直径为68 mm的螺旋触点（CuCr 75/25）和19 kA（RMS）的50 Hz半波正弦电流进行开关测试。使用热像仪检查阳极点的温度。我们假设辐射率为0.3，在加热阶段阳极点温度最高为2650K。在冷却阶段，温度在2118 K下0.55 ms之后和1863 K下1.10 ms之后降低。

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