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A 81nW Error Amplifier Design for Ultra Low Leakage Retention Mode Operation of 4Mb SRAM Array in 40nm LSTP Technology

机译:40NM LSTP技术中4MB SRAM阵列超低漏保留模式操作的81NW误差放大器设计

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In advanced technology nodes, static power consumption dominates system power in applications that do not operate at high frequency. SRAM leakage is a major component of static power consumption of a SOC. In this paper, we propose a 81nW ultra low power error amplifier to control retention leakage of 4Mb SRAM array. The overall memory subsystem leakage power reduces by 50% from no retention case and 33% from the conventional retention solution at TT (25°C). At FNSP (140°C) leakage power reduces by 75% from no retention & 69% from conventional solution. Monte Carlo analysis shows the 3σ variations are within guard band limits.
机译:在先进的技术节点中,静态功耗占据在高频工作的应用中的系统电源。 SRAM泄漏是SoC的静态功耗的主要组成部分。在本文中,我们提出了81NW超低功率误差放大器,以控制4MB SRAM阵列的保留泄漏。整体内存子系统泄漏功率从无保留情况降低了50%,并且从TT(25°C)的传统保留溶液中的33%。在FNSP(140°C)下,漏电功率从常规溶液中没有滞留和69%的75%减少了75%。 Monte Carlo分析显示3σ变化在保护带内限制。

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