首页> 外文会议>IEEE International System-on-Chip Conference >Analytical noise model for avalanche ISFET sensor suitable for Next Generation Sequencing
【24h】

Analytical noise model for avalanche ISFET sensor suitable for Next Generation Sequencing

机译:适用于下一代测序的雪崩ISFET传感器的分析噪声模型

获取原文

摘要

In this paper the noise behavior of a novel Avalanche Ion Sensitive Field Effect Transistor (A-ISFET) is presented. The A-ISFET is an ion sensitive field effect transistor that can inherently deliver high sensitivity through a multiplication factor, M, similar to an avalanche photodiode, where they are used when the input signal is very weak. A physical model for both intrinsic and extrinsic noise mechanisms in an A-ISFET is derived. We developed an analytical model for the A-ISFET signal-to-noise ratio (SNR) to maximize SNR at a specific operating point, as a function of current components, noise sources and overall structure and operation. Based on our noise model, an optimum value for the multiplication gain is found to maximize SNR sensitivity of the A-ISFET sensor.
机译:本文提出了一种新颖的雪崩离子敏感场效应晶体管(A-ISFET)的噪声行为。 A-ISFET是离子敏感场效应晶体管,可以通过类似于雪崩光电二极管的乘法系数M固有地提供高灵敏度,当输入信号非常弱时使用它们。衍生出A-ISFET中内在和外部噪声机制的物理模型。我们开发了一种用于A-ISFET信噪比(SNR)的分析模型,以最大限度地在特定操作点处最大化SNR,作为电流分量,噪声源和整体结构和操作的函数。基于我们的噪声模型,发现乘法增益的最佳值最大化A-ISFET传感器的SNR灵敏度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号